Following up on today's Webinar which provided a lot of food for thought, TEVAL is happy to be able to make the accompanying power point available. Thanks again to Dr. Isbell for the wonderful webinar and for allowing us access to these slides.
We are pleased to provide our members with the slides for the recent plenary given by Dr. Isbell at the PanSIG conference: Hype and High-Tech Language Tests: Staying Grounded with Language Assessment Fundamentals. Thank you to Dr. Isbell for your wonderful speech and also for sharing your slides with us.
Shiken is seeking submissions for future publications. Shiken - The JALT TEVAL SIG journal is published twice a year in June and December. Submissions received 3 months prior to publication date will be considered, although earlier submission is encouraged to allow time for review and revision. Shiken aims to publish articles concerning language assessment issues relevant to classroom practitioners and language program administrators.
TEVAL holds regular informal meetings on ZOOM. These meetings are a chance for members to get to know each other more and to share experiences, news, and ideas related to testing and assessment in Japan. Join the meeting at anytime within the announced schedule for as long (or as short) as you like. TEVAL SIG members should receive meeting details via email. If you would like to attend but haven't received a link for the meeting, please email us at teval@jalt.org. We look forward to seeing you.
The TEVAL SIG is proud to announce the publication of Statistics Corner: Questions and Answers about Language Testing Statistics (340 pages), written by James Dean Brown, and available for $29.95 on the Amazon website. To receive a free copy, join the TEVAL SIG (2,000 yen).
