Shiken New Issue
The TEVAL SIG is pleased to announce it has published another volume of Shiken 28.1 (Nov.
The TEVAL SIG is pleased to announce it has published another volume of Shiken 28.1 (Nov.
TEVAL is proud to be co-sponsoring in association with Okinawa JALT and Tokyo JALT, two of the plenary speakers for the upcoming JALT international conference in Shizuoka: Dr. Andy Curtis & Dr. Liying Cheng (Joint Opening Plenary Session). We are really looking forward to hearing their talk along with the workshops each will hold. For more information on this and the upcoming conference at GRANSHIP in Shizuoka please click on here.
Following up on today's Webinar which provided a lot of food for thought, TEVAL is happy to be able to make the accompanying power point available. Thanks again to Dr. Isbell for the wonderful webinar and for allowing us access to these slides.
We are pleased to provide our members with the slides for the recent plenary given by Dr. Isbell at the PanSIG conference: Hype and High-Tech Language Tests: Staying Grounded with Language Assessment Fundamentals. Thank you to Dr. Isbell for your wonderful speech and also for sharing your slides with us.
Shiken is seeking submissions for future publications. Shiken - The JALT TEVAL SIG journal is published twice a year in June and December. Submissions received 3 months prior to publication date will be considered, although earlier submission is encouraged to allow time for review and revision. Shiken aims to publish articles concerning language assessment issues relevant to classroom practitioners and language program administrators.
TEVAL holds regular informal meetings on ZOOM. Our next scheduled meeting will be held on October 23 from 8pm - 9pm. The format is a little different this time: Jeffrey Martin (our program chair) and Sachi Oshima will talk about a paper they recently published titled “Using peer-led evaluation in productive and receptive L2 coursework.” Rather than a presentation this will be more like an informal conversation, and listener questions and feedback will be welcome. Those interested can view the paper here.
The TEVAL SIG is proud to announce the publication of Statistics Corner: Questions and Answers about Language Testing Statistics (340 pages), written by James Dean Brown, and available for $29.95 on the Amazon website. To receive a free copy, join the TEVAL SIG (2,000 yen).