TEVAL 2017 Officers
Officers of the Testing & Evaluation SIG are elected for one year terms of office at the TEVAL SIG Annual General Meeting at the JALT Annual Conference. Newletter Reviewers are appointed and serve for a mutually agreed time frame.
Aaron Hahn, Jeff Durand, Jeff Hubbell, Keita Kikuchi, Rie Koizumi, J. Lake, Ed Schaeffer, James Sick
Officers At Large
Jeff Hubbell, Jonathon Trace, Bill Stoeckel, Nat Carney, Steven Bohme, and Louis Lui
If you are interested in being an officer of this SIG please contact any of the persons above or use our contact form.