Events of the TEVAL SIG

Introduction to Language Assessments
The TEVAL SIG is co-sponsoring this event with the JALT Kyoto Chapter.
Date: Saturday, 22 April 2017, 1:00pm - 5:00pm
Speakers: J. Lake (Fukuoka Jogakuin University), Trevor Holster (Fukuoka University), Bill Pellowe (Kindai University)
Location: Campus Plaza Kyoto (5 minutes walk from JR Kyoto Station), 2F Hall, Kyoto

JALT PanSIG 2017 Conference
The TEVAL SIG will participate in this conference.
Dates: May 20-21, 2017
Venue: AIU in Akita.

The forum speaker, Tim Stoeckel (University of Niigata Prefecture), is co-sponsored by the TEVAL SIG and the Vocabulary SIG. The forum will be held on Sunday from 11:00 am - 12 noon.

A Serial Multiple-Choice Vocabulary Test Format

The Vocabulary Size Test (VST) was designed to measure the vocabulary needed for reading (Nation, 2012). Researchers have argued, however, that the lexical knowledge needed for the multiple-choice format of the VST (meaning recognition) fundamentally differs from that which is needed in authentic reading (meaning recall) (Stewart, 2014). Studies comparing the VST to meaning recall measures have found that the VST produces significantly higher scores (Zhang 2013). The presenter introduces and describes a pilot study of a 'serial multiple-choice' test format designed to address this issue. The forum then opens for broader discussion of future directions in vocabulary assessment.

JLTA 2017: The 21st Annual Conference of the Japan Language Testing Association
The TEVAL SIG will participate in this conference.
Dates: September 9-10, 2017
Venue: University of Aizu (Aizu-Wakamatsu, Fukushima Prefecture

2017 JALT International Conference.
The TEVAL SIG will participate in this conference.
Dates: November 17-20, 2017
Venue: Tsukuba International Congress Center (Epochal Tsukuba), Tsukuba, Ibaraki Prefecture


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