JALT TEVAL (Testing and Evaluation) SIG

The TEVAL SIG is a Special Interest Group of the Japan Association for Language Teaching (全国言語教育学会).

The 22nd Japan Language Testing Association Annual Conference: Call for Papers

JLTA logoThe Japan Language Testing Association (JLTA) invites presentation proposals for its annual conference related to the conference theme, "Evaluating Language Assessments in Japan," and to language testing and assessment in general. The JALT TEVAL SIG is a co-sponsor of JLTA 2018.

Shiken 21.2 (December 2017)

Shiken is the publication of JALT's TEVAL SIG.
Download the Complete Issue

Statistics Corner: Questions and Answers about Language Testing Statistics

Statistics Corner book coverThe TEVAL SIG is proud to announce the publication of Statistics Corner: Questions and Answers about Language Testing Statistics (340 pages), written by James Dean Brown, and available for $29.95 on the Amazon website. To receive a free copy, join the TEVAL SIG (2,000 yen).

Background

全国語学教育学会 試験と評価研究部会
The Japan Association for Language Teaching Testing & Evaluation Special Interest Group

JALT's Testing & Evaluation SIG was established in 1996 with these goals:

  • To publish and distribute a regular newsletter with articles related to foreign language testing and evaluation.
  • To provide a venue for participants to exchange information about research and discuss testing-related concerns.
  • To organize local, regional, as well as national events under the auspices of JALT.
  • To ensure regular ties with the affiliates of other professional organizations such as TESOL, JLTA and ILTA which have common interests and goals.
  • To host a range of activities at the annual JALT conferences.

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