Shiken: JALT Testing & Evaluation SIG Newsletter

Editorial Board

Editors and reviewers are approved annually at the SIG Annual General Meeting & Materials Exhibition
held during the JALT Annual Conference.



Contracted Chief Editor


Aaron Olaf Batty
(Keio University)
abatty at sfc dot keio dot ac dot jp

Associate Editors


Jeff Durand
(Tokai University)

Aaron Gibson
(Kyushu Sangyo University)

Jeff Stewart
(Kyushu Sangyo University)

Statistics Column Editor


J.D. Brown
(University of Hawaii at Manoa)

Rasch Column Editor


James Sick
(International Christian University, Tokyo)

Reviewers


Vahid Aryadoust
(National Institute of Education, Singapore)

Aaron Gibson
(Kyushu Sangyo University)

Jeff Hubbell
(Hosei University)

H.P.L. Molloy
(Toyo University)

Ian Mumby
(Hokkai Gakuen University)

Ed Schaeffer
(Ochanomizu University)

Jeff Stewart
(Kyushu Sangyo University)

NOTE: If you're interested in serving as a reviewer, please contact any of the persons listed above


Newsletter: Topic IndexAuthor IndexTitle IndexDate Index
TEVAL SIG: Main Page Background Links Network Join
http://jalt.org/test/editors.htm